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Coffee and controversy: How applied psychology can revitalize sexual harassment and racial discrimination training
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- Industrial and Organizational Psychology / Volume 13 / Issue 2 / June 2020
- Published online by Cambridge University Press:
- 27 January 2020, pp. 117-136
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Atom Probe Tomography Productivity Enhancements
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 522-523
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- August 2019
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Improved Data Analysis with IVAS 4 and AP Suite
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 302-303
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- August 2019
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Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 338-339
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- August 2019
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A High Multiple Hits Correction Factor for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1084-1085
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- August 2018
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Improving Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2088-2089
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- August 2014
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Improved Mass Resolving Power and Yield in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 994-995
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- August 2013
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Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 720-721
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- July 2011
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Improved Yield and Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 714-715
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- July 2011
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MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 754-755
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- July 2011
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Analytic Hitmap Equation of the Ideal Spherical Evaporator
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 728-729
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- July 2011
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Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 270-271
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- July 2010
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Wide-Field-of-View Atom Probe Reconstruction
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 292-293
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- July 2009
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Background Removal Methods Applied to Atom Probe Data
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 256-257
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- July 2009
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Improvements in Three-Dimensional Compositional Analysis of Complex Alloys
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 294-295
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- July 2009
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Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1230-1231
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- August 2008
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Thermal Stability of Co-Fe and Cu Multilayered Thin Films
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 48-49
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- August 2003
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Configuration and Performance of a Local Electrode Atom Probe
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 564-565
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- August 2003
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First Data from a Commercial Local Electrode Atom Probe
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 1094-1095
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- August 2002
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